Cite the Paper
Frequencies to Distress Human Mind , 3(1), 276-279. DOI:10.63844/ijaitr.v3.i1.2026.276-279
@article{Goyal_2026, title={Frequencies to Distress Human Mind}, volume={3}, ISSN={3048-5088}, url={http://dx.doi.org/10.63844/ijaitr.v3.i1.2026.276-279}, DOI={10.63844/ijaitr.v3.i1.2026.276-279}, number={1}, journal={International Journal of Advancement and Innovation in Technology and Research}, publisher={Acropolis Institute of Technology and Research}, author={Goyal, Vagisha and Rai, Vaidika and Bhatri, Harsh and Pandit, Yash Raj and Lashkari, Shruti}, year={2026}, month=jan, pages={276–279} }
Goyal, V., Rai, V., Bhatri, H., Pandit, Y. R., & Lashkari, S. (2026). Frequencies to Distress Human Mind. International Journal of Advancement and Innovation in Technology and Research, 3(1), 276–279. https://doi.org/10.63844/ijaitr.v3.i1.2026.276-279
[1]V. Goyal, V. Rai, H. Bhatri, Y. R. Pandit, and S. Lashkari, “Frequencies to Distress Human Mind,” International Journal of Advancement and Innovation in Technology and Research, vol. 3, no. 1, pp. 276–279, Jan. 2026, doi: 10.63844/ijaitr.v3.i1.2026.276-279.
Goyal, Vagisha, et al. “Frequencies to Distress Human Mind.” International Journal of Advancement and Innovation in Technology and Research, vol. 3, no. 1, Jan. 2026, pp. 276–79. Crossref, https://doi.org/10.63844/ijaitr.v3.i1.2026.276-279.
1.Goyal V, Rai V, Bhatri H, Pandit YR, Lashkari S. Frequencies to Distress Human Mind. International Journal of Advancement and Innovation in Technology and Research [Internet]. 2026 Jan 1;3(1):276–9. Available from: http://dx.doi.org/10.63844/ijaitr.v3.i1.2026.276-279
Goyal, Vagisha, Vaidika Rai, Harsh Bhatri, Yash Raj Pandit, and Shruti Lashkari. “Frequencies to Distress Human Mind.” International Journal of Advancement and Innovation in Technology and Research 3, no. 1 (January 1, 2026): 276–79. https://doi.org/10.63844/ijaitr.v3.i1.2026.276-279.
Goyal, V, Rai, V, Bhatri, H, Pandit, YR & Lashkari, S 2026, ‘Frequencies to Distress Human Mind’, International Journal of Advancement and Innovation in Technology and Research, vol. 3, no. 1, Acropolis Institute of Technology and Research, pp. 276–279, viewed http://dx.doi.org/10.63844/ijaitr.v3.i1.2026.276-279.